ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

Sub-classifications for 714
ClassificationsCodeApplicationsSubscribe
 
DATA PROCESSING SYSTEM ERROR OR FAULT HANDLING714/1000000
 
Reliability and availability714/0010000
 
Fault recovery714/0020002
 
By masking or reconfiguration714/0030001
 
Of network714/0040001
 
Of memory or peripheral subsystem714/0050000
 
Redundant stored data accessed (e.g., duplicated data, error correction coded data, or other parity-type data)714/0060001
 
Reconfiguration (e.g., adding a replacement storage component)714/0070000
 
Isolating failed storage location (e.g., sector remapping)714/0080000
 
Access processor affected (e.g., I/O processor, MMU, DMA processor)714/0090000
 
Of processor714/0100000
 
Concurrent, redundantly operating processors714/0110000
 
Synchronization maintenance of processors714/0120000
 
Prepared backup processor (e.g., initializing cold backup) or updating backup processor (e.g., by checkpoint message)714/0130000
 
Of power supply714/0140000
 
State recovery (i.e., process or data file)714/0150000
 
Forward recovery (e.g., redoing committed action)714/0160000
 
Reexecuting single instruction or bus cycle714/0170000
 
Transmission data record (e.g., for retransmission)714/0180000
 
Undo record714/0190000
 
Plural recovery data sets containing set interrelation data (e.g., time values or log record numbers)714/0200000
 
State validity check714/0210000
 
With power supply status monitoring714/0220000
 
Resetting processor714/0230000
 
Safe shutdown714/0240000
 
Fault locating (i.e., diagnosis or testing)714/0250000
 
Artificial intelligence (e.g., diagnostic expert system)714/0260001
 
Particular access structure714/0270000
 
Substituted emulative component (e.g., emulator microprocessor)714/0280000
 
Memory emulator feature714/0290000
 
Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path)714/0300000
 
Additional processor for in-system fault locating (e.g., distributed diagnosis program)714/0310000
 
Particular stimulus creation714/0320000
 
Derived from analysis (e.g., of a specification or by stimulation)714/0330000
 
Halt, clock, or interrupt signal (e.g., freezing, hardware breakpoint, single-stepping)714/0340000
 
Substituted or added instruction (e.g., code instrumenting, breakpoint instruction)714/0350001
 
Test sequence at power-up or initialization714/0360000
 
Analysis (e.g., of output, state, or design)714/0370001
 
Of computer software714/0380001
 
Monitor recognizes sequence of events (e.g., protocol or logic state analyzer)714/0390000
 
Component dependent technique714/0400000
 
For reliability enhancing component (e.g., testing backup spare, or fault injection)714/0410000
 
Memory or storage device component fault714/0420000
 
Bus, I/O channel, or network path component fault714/0430000
 
Peripheral device component fault714/0440000
 
Output recording (e.g., signature or trace)714/0450000
 
Operator interface for diagnosing or testing714/0460000
 
Performance monitoring for fault avoidance714/0470000
 
Error detection or notification714/0480000
 
State error (i.e., content of instruction, data, or message)714/0490000
 
State out of sequence714/0500000
 
Control flow state sequence monitored (e.g., watchdog processor for control-flow checking)714/0510000
 
Error checking code714/0520000
 
Address error714/0530000
 
Storage content error714/0540000
 
Timing error (e.g., watchdog timer time-out)714/0550000
 
Bus or I/O channel device fault714/0560000
 
Error forwarding and presentation (e.g., operator console, error display)714/0570002
 
PULSE OR DATA ERROR HANDLING714/6990000
 
Skew detection correction714/7000000
 
Data formatting to improve error detection correction capability714/7010000
 
Memory access (e.g., address permutation)714/7020000
 
Testing of error-check system714/7030000
 
Error count or rate714/7040000
 
Pseudo-error rate714/7050000
 
Up-down counter714/7060000
 
Synchronization control714/7070000
 
Shutdown or establishing system parameter (e.g., transmission rate)714/7080000
 
Data pulse evaluation/bit decision714/7090000
 
Replacement of memory spare location, portion, or segment714/7100000
 
Spare row or column714/7110000
 
Transmission facility testing714/7120000
 
For channel having repeater714/7130000
 
By tone signal714/7140000
 
Test pattern with comparison714/7150000
 
Loop-back714/7160000
 
Loop or ring configuration714/7170000
 
Memory testing714/7180000
 
Read-in with read-out and compare714/7190000
 
Special test pattern (e.g., checkerboard, walking ones)714/7200000
 
Electrical parameter (e.g., threshold voltage)714/7210001
 
Performing arithmetic function on memory contents714/7220000
 
Error mapping or logging714/7230000
 
Digital logic testing714/7240001
 
Programmable logic array (PLA) testing714/7250000
 
Scan path testing (e.g., level sensitive scan design (LSSD))714/7260000
 
Boundary scan714/7270000
 
Random pattern generation (includes pseudorandom pattern)714/7280000
 
Plural scan paths714/7290000
 
Addressing714/7300000
 
Clock or synchronization714/7310000
 
Signature analysis714/7320000
 
Built-in testing circuit (BILBO)714/7330001
 
Structural (in-circuit test)714/7340000
 
Device response compared to input pattern714/7350000
 
Device response compared to expected fault-free response714/7360000
 
Device response compared to fault dictionary/truth table714/7370000
 
Including test pattern generator714/7380001
 
Random pattern generation (includes pseudorandom pattern)714/7390000
 
Having analog signal714/7400000
 
Simulation714/7410000
 
Testing specific device714/7420000
 
Addressing714/7430000
 
Clock or synchronization714/7440000
 
Determination of marginal operation limits714/7450000
 
Digital data error correction714/7460000
 
Substitution of previous valid data714/7470000
 
Request for retransmission714/7480002
 
Retransmission if no ACK returned714/7490001
 
Feedback to transmitter for comparison714/7500000
 
Including forward error correction capability714/7510000
 
Forward correction by block code714/7520000
 
Double error correcting with single error correcting code714/7530000
 
Error correction during refresh cycle714/7540000
 
Double encoding codes (e.g., product, concatenated)714/7550002
 
Cross-interleave Reed-Solomon code (CIRC)714/7560000
 
Parallel generation of check bits714/7570000
 
Error correcting code with additional error detection code (e.g., cyclic redundancy character, parity)714/7580000
 
Look-up table encoding or decoding714/7590000
 
Threshold decoding (e.g., majority logic)714/7600000
 
Random and burst error correction714/7610000
 
Burst error correction714/7620000
 
Memory access714/7630002
 
Error correct and restore714/7640000
 
Error pointer714/7650000
 
Check bits stored in separate area of memory714/7660000
 
Code word for plural n-bit (n>1) storage units (e.g., x4 DRAM's)714/7670000
 
Error correction code for memory address714/7680000
 
Dynamic data storage714/7690000
 
Disk array714/7700000
 
Tape714/7710000
 
Code word parallel access714/7720000
 
Solid state memory714/7730000
 
Adaptive error-correcting capability714/7740000
 
Synchronization714/7750000
 
For packet or frame multiplexed data714/7760000
 
Hamming code714/7770000
 
Nonbinary data (e.g., ternary)714/7780000
 
Variable length data714/7790000
 
Using symbol reliability information (e.g., soft decision)714/7800000
 
Code based on generator polynomial714/7810000
 
Bose-Chaudhuri-Hocquenghem code714/7820000
 
Golay code714/7830000
 
Reed-Solomon code714/7840000
 
Syndrome computed714/7850000
 
Forward error correction by tree code (e.g., convolutional)714/7860000
 
Random and burst errors714/7870000
 
Burst error714/7880000
 
Synchronization714/7890000
 
Puncturing714/7900000
 
Sequential decoder (e.g., Fano or stack algorithm)714/7910000
 
Trellis code714/7920000
 
Syndrome decodable (e.g., self orthogonal)714/7930000
 
Maximum likelihood714/7940000
 
Viterbi decoding714/7950000
 
Branch metric calculation714/7960000
 
Majority decision/voter circuit714/7970000
 
Error detection for synchronization control714/7980000
 
Error/fault detection technique714/7990000
 
Parity bit714/8000000
 
Parity generator or checker circuit detail714/8010000
 
Even and odd parity714/8020000
 
Parity prediction714/8030000
 
Plural dimension parity check714/8040000
 
Storage accessing (e.g., address parity check)714/8050000
 
Constant-ratio code (m/n)714/8060000
 
Check character714/8070000
 
Modulo-n residue check character714/8080000
 
Code constraint monitored714/8090000
 
Multilevel coding (n>2)714/8100000
 
Forbidden combination or improper condition714/8110000
 
Specified digital signal or pulse count714/8120000
 
Two key-down detector714/8130000
 
Data timing/clocking714/8140000
 
Time delay/interval monitored714/8150000
 
Two-rail logic714/8160000
 
Noise level714/8170000
 
Missing-bit/drop-out detection714/8180000
 
Comparison of data714/8190000
 
Plural parallel devices of channels714/8200000
 
Transmission facility714/8210000
 
Sequential repetition714/8220000
 
True and complement data714/8230000
 
Device output compared to input714/8240000
 
FOREIGN ART COLLECTIONS7140
 
CLASS-RELATED FOREIGN DOCUMENTS714/FOR0000
 
MEMORY TESTING (371/21.1)7140
 
DIGITAL LOGIC TESTING (371/22.1)7140
 
DIGITAL DATA ERROR CORRECTION (371/30)7140
 
Scan path testing (LSSD) (371/22.3)714/FOR1000
 
Including test pattern generator (371/27)714/FOR1010
 
Block code (371/37.1)714/FOR1020
 
Memory access (371/40.1)714/FOR1030
 
Convolutional code (371/43)714/FOR1040
 
ERROR/FAULT ANTICIPATION (371/4)714/FOR2880
 
Replacement with spare device or system (371/8.1)7140
 
Transmission facility or channel (371.8.2)714/FOR2890
 
Memory (371/10.1)714/FOR2900
 
Transmission facility (371/11.2)714/FOR2910
 
Data processor or computer (371/11.3)714/FOR2920
 
DIAGNOSTIC TESTING (371/15.1)7140
 
Programmable processor testing (371/16.1)714/FOR2930
 
Emulator device (371/16.2)714/FOR2940
 
Watchdog timer (e.g., time-out) (371/16.3)714/FOR2950
 
Processor within diverse (microwave, photocopier) (371/16.4)714/FOR2960
 
Error or fault, logging or tracking (371/16.5)714/FOR2970
 
Dedicated maintenance subsystem (371/18)714/FOR2980
 
Testing of external device by programmable digital computer (371/20)714/FOR2990
 
ERROR DETECTION FOR SYNCHRONIZATION CONTROL (371/47.1)714/FOR3000
 
ERROR DETECTION; ERROR CORRECTION; MONITORING (EPO)714/E110011
 
Error detection other than by redundancy in data representation, operation, or hardware, or by checking the order of processing (EPO)714/E110020
 
By time limit, i.e., time-out (EPO)714/E110030
 
By count or rate limit, e.g., word- or bit count limit, etc. (EPO)714/E110040
 
By other limits, e.g., analog values, etc. (EPO)714/E110050
 
By bit configuration check, e.g., of formats or tags, etc. (EPO)714/E110060
 
Error correction, recovery or fault tolerance using at least two different redundancy techniques and at least one technique not involving redundancy (EPO)714/E110070
 
Fault tolerant software (EPO)714/E110080
 
In regular structures, i.e., all of the systems nodes have the same number of connections per node (EPO)714/E110090
 
Interconnection networks, i.e., comprising interconnecting link and switching elements (EPO)714/E110100
 
Fault-tolerant routing (EPO)714/E110110
 
In rings and buses (EPO)714/E110120
 
In n-dimensional structures, e.g., arrays, trees, cubes, etc. (EPO)714/E110130
 
Neural networks (EPO)714/E110140
 
By degradation, i.e., a slow-down occurs but full processing capability is maintained, e.g., discarding a faulty element or unit, etc. (EPO)714/E110150
 
In systems, e.g., multiprocessors, etc. (EPO)714/E110160
 
Security measures, i.e., ensuring safe condition in the event of error, e.g., for controlling element (EPO)714/E110170
 
Protecting against parasitic influences, e.g., noise, temperatures, etc. (EPO)714/E110180
 
Identification, e.g., of a performed repair, of a defined circuit, etc. (EPO)714/E110190
 
Reliability or availability analysis (EPO)714/E110200
 
Responding to the occurrence of a fault, e.g., fault tolerance, etc. (EPO)714/E110210
 
Error or fault processing without redundancy, i.e., by taking additional measures to deal with the error/fault (EPO)714/E110220
 
Error or fault handling (EPO)714/E110230
 
Error or fault detection or monitoring (EPO)714/E110240
 
Error or fault reporting or logging (EPO)714/E110250
 
Error or fault localization (EPO)714/E110260
 
By collation, i.e., correlating different errors (EPO)714/E110270
 
By identifying the faulty software code (EPO)714/E110280
 
Error or fault analysis (EPO)714/E110291
 
Error detection or correction by redundancy in data representation, e.g., by using checking codes, etc. (EPO)714/E110300
 
Using codes with inherent redundancy, e.g., n-out-of-m codes (EPO)714/E110310
 
Adding special bits or symbols to the coded information, e.g., parity check, casting out 9's or 11's, etc. (EPO)714/E110321
 
Using arithmetic codes i.e., codes which are preserved during operation, e.g., modulo 9 or 11 check, etc. (EPO)714/E110330
 
In memories (EPO)714/E110340
 
In static stores (EPO)714/E110350
 
Integrated on a chip (EPO)714/E110360
 
In cache or content addressable memories (EPO)714/E110370
 
In sector programmable memories, e.g., flash disk, etc. (EPO)714/E110380
 
In multilevel memories (EPO)714/E110390
 
To protect a block of data words, e.g., CRC, checksum, etc. (EPO)714/E110400
 
To protect individual data words written into, or read out of, the addressable memory subsystem of data processing equipment (EPO)714/E110410
 
Codes or arrangements adapted for a specific type of error (EPO)714/E110420
 
Error in accessing a memory location, i.e., addressing error (EPO)714/E110430
 
Error in check bits (EPO)714/E110440
 
Identification of the type of error (EPO)714/E110450
 
Adjacent error, e.g., error in n-bit (n>1) wide storage units, i.e., package error, etc. (EPO)714/E110460
 
Simple parity (EPO)714/E110470
 
Unidirectional errors (EPO)714/E110480
 
Arrangements adapted for a specific error detection or correction feature (EPO)714/E110490
 
Bypassing or disabling error detection or correction (EPO)714/E110500
 
Updating check bits on partial write, i.e., read/modify/write (EPO)714/E110510
 
Correcting systematically all correctable errors, i.e., scrubbing (EPO)714/E110520
 
Using single parity bit (EPO)714/E110530
 
Error detection or correction of the data by redundancy in hardware (EPO)714/E110540
 
Error detection by comparing the output signals of redundant hardware (EPO)714/E110550
 
In static storage, e.g., matrix, registers, etc. (EPO)714/E110560
 
In coding, decoding circuits, e.g. parity circuits (EPO)714/E110570
 
In communications, e.g., transmission, interfaces, etc. (EPO)714/E110580
 
Control processors, e.g., for sensors, actuators, etc. (EPO)714/E110590
 
With exchange of data between units (EPO)714/E110600
 
With data processors, i.e., data processors compare their computations (EPO)714/E110610
 
In storage with relative movement between record carrier and transducer, e.g., tapes, disks, etc. (EPO)714/E110620
 
In systems, i.e. comprising a multiplicity of resources, e.g., cpu with its memory and I/O, etc. (EPO)714/E110630
 
In arithmetic, logic or counter circuits or a combination thereof, e.g., alu, adder, etc. (EPO)714/E110640
 
In I/O devices or adapters therefor (EPO)714/E110650
 
Displays (EPO)714/E110660
 
Timing and synchronization therein (EPO)714/E110670
 
By using fault tolerant clocks (EPO)714/E110680
 
Using passive fault-masking of the redundant circuits, e.g., by quadding or by majority decision circuits, etc. (EPO)714/E110690
 
Synchronization therefor (EPO)714/E110700
 
Using active fault-masking, e.g., by switching out faulty elements or by switching in spare elements, etc. (EPO)714/E110710
 
In systems, e.g., multiprocessors, etc. (EPO)714/E110720
 
In distributed systems (EPO)714/E110730
 
In regular structures (EPO)714/E110740
 
Array of processors, e.g., systolic arrays, etc. (EPO)714/E110750
 
Hypercubes (EPO)714/E110760
 
Trees (EPO)714/E110770
 
In interconnections, e.g., rings, etc. (EPO)714/E110780
 
Bus (EPO)714/E110790
 
Data exchange between units, e.g., for updating backup units, etc. (EPO)714/E110800
 
For control, e.g., actuators, etc. (EPO)714/E110810
 
In arithmetic units (EPO)714/E110820
 
Redundant power supplies (EPO)714/E110830
 
Masking faults in storage systems using spares and/or by reconfiguring (EPO)714/E110840
 
Removing defective units from operation (EPO)714/E110850
 
Bypassing defective units on a serial bus (EPO)714/E110860
 
With address translations and modifications (EPO)714/E110870
 
Handling defects in a Redundant Array of Inexpensive Disks (RAID) by remapping (EPO)714/E110880
 
Managing spare storage units (EPO)714/E110890
 
Hot spares (EPO)714/E110900
 
Via redundancy in hardware accessing the storage components (EPO)714/E110910
 
Using redundant I/O processors, storage control units or array controllers (EPO)714/E110920
 
With serial buses (EPO)714/E110930
 
To file servers (EPO)714/E110940
 
Connection redundancy between storage system components (EPO)714/E110950
 
With serial buses (EPO)714/E110960
 
To file servers (EPO)714/E110970
 
Using the replication of data, e.g., with two or more copies, etc. (EPO)714/E110980
 
Duplex memories, e.g., twin boot ROMs, etc. (EPO)714/E110990
 
Duplexed caches, e.g., cashe paired with non-volatile storage, etc. (EPO)714/E111000
 
Mirroring, i.e., the concept of maintaining data on two or more units in the same state at all times (EPO)714/E111010
 
Resynchronization of failed mirrors (EPO)714/E111020
 
Mirror management, e.g., pairing of units, etc. (EPO)714/E111030
 
Mirroring on the same storage unit (EPO)714/E111040
 
Mirroring on different storage units with a common controller (RAID 1) (EPO)714/E111050
 
Mirroring with multiple controllers (EPO)714/E111060
 
Asynchronous mirroring (EPO)714/E111070
 
Synchronous mirroring (EPO)714/E111080
 
De-clustering of replicated data (EPO)714/E111090
 
Using more than two copies (EPO)714/E111100
 
In Logic Arrays, e.g., programmable or iterative logic arrays, etc. (EPO)714/E111110
 
Error detection or correction of the data by redundancy in operation (EPO)714/E111120
 
Saving, restoring, recovering or retrying (EPO)714/E111131
 
At machine instruction level (EPO)714/E111140
 
Checkpointing the instruction stream (EPO)714/E111150
 
For bus or memory accesses (EPO)714/E111160
 
Of application data (EPO)714/E111170
 
Backing up, restoring or mirroring files or drives (EPO)714/E111180
 
Backing up, i.e., point-in-time backup (EPO)714/E111190
 
Hardware arrangements for backup (EPO)714/E111200
 
Backup Management techniques (EPO)714/E111210
 
Recovery techniques (EPO)714/E111220
 
Selection of contents (EPO)714/E111230
 
Scheduling policy (EPO)714/E111240
 
For networked environments (EPO)714/E111250
 
Nondisruptive backup (EPO)714/E111260
 
Mirroring (EPO)714/E111270
 
Distributed database systems; Replica control (EPO)714/E111280
 
Synchronization between mobile agents and networked agents (EPO)714/E111290
 
Using logs or checkpoints (EPO)714/E111300
 
In transactions (EPO)714/E111310
 
At operating system level (EPO)714/E111320
 
Boot up procedures (EPO)714/E111330
 
Reconfiguring to eliminate the error (EPO)714/E111340
 
During software upgrading (EPO)714/E111350
 
At file system or disk access level (EPO)714/E111360
 
Restarting or rejuvenating (EPO)714/E111370
 
Resetting or repowering (EPO)714/E111380
 
Cleaning up resources (EPO)714/E111390
 
Suspending and resuming a running system (EPO)714/E111400
 
Transmit or communication errors (EPO)714/E111410
 
Error detection (EPO)714/E111420
 
By time redundancy (EPO)714/E111430
 
Error avoidance, e.g., error spreading countermeasures, fault avoidance, etc. (EPO)714/E111440
 
Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g., start-up testing, etc. (EPO)714/E111450
 
Verification or detection of system hardware configuration (EPO)714/E111460
 
Logging of test results (EPO)714/E111470
 
Test methods (EPO)714/E111480
 
Power-On Test, e.g., POST, etc. (EPO)714/E111490
 
Configuration test (EPO)714/E111500
 
Background testing (EPO)714/E111510
 
Periodic testing (EPO)714/E111520
 
Test trigger logic (EPO)714/E111530
 
Marginal checking (EPO)714/E111540
 
Testing of logic operation, e.g., by logic analyzers, etc. (EPO)714/E111550
 
Using Fault Dictionaries (EPO)714/E111560
 
Using Expert Systems (EPO)714/E111570
 
Using Neural Networks (EPO)714/E111580
 
Functional testing (EPO)714/E111590
 
Reconfiguring circuits for testing, e.g., LSSD, partitioning, etc. (EPO)714/E111600
 
Test of buses, lines or interfaces, e.g., stuck-at or open line faults, etc. (EPO)714/E111610
 
Test or error correction or detection circuits (EPO)714/E111620
 
Test of input/output devices or peripheral units (EPO)714/E111630
 
Test of ALU (EPO)714/E111640
 
Test of interrupt circuits (EPO)714/E111650
 
Test of CPU or processors (EPO)714/E111660
 
By simulating additional hardware, e.g., fault simulation, (EPO)714/E111670
 
Emulators (EPO)714/E111680
 
Built-in tests (EPO)714/E111690
 
Tester hardware, i.e., output processing circuits, etc. (EPO)714/E111700
 
Test interface between tester and unit under test (EPO)714/E111710
 
Using a storage for the test inputs, e.g., test-ROM, script files, etc. (EPO)714/E111720
 
Remote test (EPO)714/E111730
 
Using a dedicated service processor for test (EPO)714/E111740
 
With comparison between actual response and known fault-free response, e.g., signature analyzer, etc. (EPO)714/E111750
 
In Multi-processor systems, e.g., one processor becoming the test master, etc. (EPO)714/E111760
 
Generation of test inputs, e.g., test vectors, patterns or sequences, etc. (EPO)714/E111770
 
By checking the correct order of processing (EPO)714/E111780
 
Monitoring (EPO)714/E111791
 
With visual or acoustical indication of the functioning of the machine (EPO)714/E111800
 
Visualization of programs or trace data (EPO)714/E111810
 
Display for diagnostics, e.g., diagnostic result display, self-test user interface, etc. (EPO)714/E111820
 
Display of waveforms, e.g., of logic analyzers, etc. (EPO)714/E111830
 
Display of status information (EPO)714/E111840
 
By lamps or LED's (EPO)714/E111850
 
For error or online/offline status (EPO)714/E111860
 
Alarm or error message display (EPO)714/E111870
 
Computer systems status display (EPO)714/E111880
 
Recording or statistical evaluation of computer activity, e.g., of down time, of input/output operation, etc. (EPO)714/E111890
 
Of interconnections, e.g., interconnecting networks, etc. (EPO)714/E111900
 
Of parallel or distributed programming (EPO)714/E111910
 
Performance measurement (EPO)714/E111920
 
Workload generation, e.g., scripts, playback etc. (EPO)714/E111930
 
Benchmarking (EPO)714/E111940
 
Time measurement, e.g., response time, etc. (EPO)714/E111950
 
Of active or idle time (EPO)714/E111960
 
Performance evaluation by modeling or statistical analysis (EPO)714/E111970
 
Performance evaluation by simulation (EPO)714/E111980
 
Trace driven simulation (EPO)714/E111990
 
Performance evaluation by tracing or monitoring (EPO)714/E112000
 
For interfaces, buses (EPO)714/E112010
 
For systems (EPO)714/E112020
 
Address tracing (EPO)714/E112030
 
Data logging (EPO)714/E112040
 
Circuit details, i.e., tracer hardware (EPO)714/E112050
 
For I/O devices (EPO)714/E112060
 
Preventing errors by testing or debugging software (EPO)714/E112070
 
Software debugging (EPO)714/E112080
 
Compilers or other tools operating on the source text (EPO)714/E112090
 
Debuggers (EPO)714/E112100
 
Error checking code in the program under test (EPO)714/E112110
 
Tracing methods or tools (EPO)714/E112120
 
By using additional hardware (EPO)714/E112130
 
By making modifications to the CPU (EPO)714/E112140
 
By monitoring the bus (EPO)714/E112150
 
By emulating the CPU (EPO)714/E112160
 
User interfaces for testing or debugging software (EPO)714/E112171
 
Methods or tools for writing reliable software and for evaluating software (EPO)714/E112180
 
Methods or tools to render software testable (EPO)714/E112190
 
Software metrics (EPO)714/E112200